NAITEC Technology Centre has installed a new TESCAN VEGA-4-LM Scanning Electron Microscope (SEM), which is now operational at its facilities in Noáin. This new equipment allows us to offer high quality analysis and studies in a faster, more reliable and safer way on a wider range of samples.

 

The new equipment is characterised by its ability to work in controlled atmospheres up to almost atmospheric pressure, allowing the analysis of samples that would otherwise be impossible, such as very porous samples, wet samples, non-conductive (polymeric) samples, without breaking the vacuum and without prior preparation (metallisation – ion sputtering coating).

With this addition, NAITEC continues its commitment to technology and innovation to help industry, as it has done since its origins. It is worth noting that NAITEC was the first company in Navarre to offer analysis services using the scanning electron microscope in this community, in 1986.

Extensive experience in materials testing

NAITEC’s Technological Services department helps its customers to make informed decisions about their production processes and choice of materials by providing a range of analytical and testing services, including

• Characterisation and monitoring of metallic materials: fractures, deposits, coatings, treatments, microanalysis.
• Corrosion analysis: analysis of causes, degradation in aggressive environments, progression of corrosion, etc.
• Analysis of polymeric materials: observation and surface evolution of fractures, fibrations, porosity, analysis of paint layers…
• Development studies of new coatings and research materials.

At NAITEC, SEM microscopy is a fundamental tool for the preventive identification of future causes of failure in the in-service behaviour of materials, detecting incipient cracks, aggressive impurities or incorrect microstructures. It is also a fundamental tool for determining the “post mortem” causes of failures that have occurred and were not anticipated during the service life of the materials.

NAITEC also uses Energy Dispersive X-ray Spectroscopy (EDS or EDX) in combination with SEM microscopy for a comprehensive analysis of material composition.

Using X-rays emitted by the sample during the SEM process, EDS allows more detailed microanalysis of the features observed in the scanning electron microscope.

The new SEM incorporates high and low vacuum so that non-conductive samples (polymers/ceramics) can be analysed directly without the need to make them conductive.

Need more information about NAITEC Materials Testing?

If you are interested in our SEM microscopy services or would like to know how we can help you with your materials testing and analysis needs, please do not hesitate to contact us.